With many new methods of dust monitoring from source emission points now being in existence, it has rapidly become apparent that several of these methods are either impracticable or do not work. When it was observed that many of the various examples of sampling systems could give different results, the view was taken to provide a system based around a defined method and a clear set of equations. In order to do this it was deemed valid to view other monitoring systems to establish an understanding of methods. In applying this outlook, a better concept in stack dust analysis has developed. Numerous applications have been tied together with a focus on hiring in the necessary equipment. At this point, all real benefits of the scheme came to fruition.